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Parts transmission electron microscope
Parts transmission electron microscope











Ruedl (Commission European Communities, Brussels 1976) p.19. Riecke: “Instrument Operation for Microscopy and Microdiffraction,” in Electron Microscopy in Materials Science, Part 1, ed. Riecke: Zur Zentrierung des magnetischen Elektronenmikroskops. Haine: The electron optical system of the electron microscope. on Electron Microscopy Foundation, Leiden 1980) p.56. Troyon: “A Magnetic Field Emission Electron Probe Forming System,” in Electron Microscopy 1980, Vol.1, ed. Cleaver: Field emission electron gun system incorporating single-pole magnetic lenses. Krause: “Properties of Three Electrode Accelerating Lenses for Field Emission Electron Guns,” in Electron Microscopy 1974, Vol.1, ed. Watanabe: “Development of Field Emission Electron Gun for High Resolution 100 kV Electron Microscope,” in Electron Microscopy 1972 (The Institute of Physics, London 1972) p.20. Favard (Société Francaise de Microscopie Electronique, Paris 1970) p.87. Siegel: “A Field Emission Illuminating System for Transmission,” in Electron Microscopy 1970, Vol.2, ed. Bocciarelli (Tipografia Poliglotta Vaticana, Rome 1968) p.141. Siegel: “Development of a Field Emission Electron Source for an Electron Microscope,” in Electron Microscopy 1968, Vol.1, ed.

parts transmission electron microscope

Swanson: An asymmetric electrostatic lens for field-emission microprobe applications. Riddle: Electrostatic einzel lenses with reduced spherical aberration for use in field-emission gun. Speidel: Elektronenoptische Eigenschaften eines Strahlerzeugungssystemes mit Feldemissionskathode. Munro: “Design of Electrostatic Lenses for Field-Emission Electron Guns,” in Electron Microscopy 1972 (The Institute of Physics, London 1972) p.22.ĭ. Welter: Electron gun using a field emission source. Butler: “Digital Computer Techniques in Electron Microscopy,” in Electron Microscopy 1966, Vol.1, ed. Siegel: Oxygen-processed field emission source.

parts transmission electron microscope

Einstein: Characteristics of the hot cathode electron microscope gun. Fisk: Anisotropy of thermionic electron emission values of LaB 6 single-crystal emitter cathodes. Crawford: “Mounting Methods and Operating Characteristics for LaB 6 CathodesMounting Methods and Operating Characteristics for LaB 6 Cathodes,” in Scanning Electron Microscopy 1979/I, ed. Johari (IIT Research Institute, Chicago 1975) p.19.Ĭ.K. Yanaka: “A Highly Stable Electron Probe Obtained with LaB 6 Cathode Electron Gun,” in Scanning Electron Microscopy 1975, ed. Johari (IIT Research Institute, Chicago 1975) p.11. Crawford: “A Directly Heated LaB 6 Electron Source,” in Scanning Electron Microscopy 1975, ed. Vogt: Richtstrahlwert und Energieverteilung der Elektronen aus einem Elektronenstrahlerzeuger mit LaB 6-Kathode. Nixon (The Institute of Physics, London 1971) p.30. Ahmed: “The Use of LaB 6 and Composite Boride Cathodes in Electron Optical Instruments,” in Electron Micrsocopy and Analysis, ed. 38, 1991 (1967) Some experimental and estimated characteristics of the LaB 6 rod cathode electron gun.

parts transmission electron microscope

Broers: Electron gun using long-life LaB 6 cathode. Brown: SEM electron source: pointed tungsten filaments with long life and high brightness. Glaser: Grundlagen der Elektronenoptik (Springer, Wien 1952). Dosse: Theoretische und experimentelle Untersuchungen über Elektronenstrahler. Langmuir: Theoretical limitations of cathode-ray tubes. Vorster: Energieverteilungen von Elektronen aus einer Feldemissionskathode. Spehr: On the theory of the Boersch effect. Whelan: Energy broadening of the electron beam in the electron microscope. Loeffler: Energy-spread generation in electron-optical instruments. Boersch: Experimentelle Bestimmung der Energieverteilung in thermisch ausgelösten Elektronenstrahlen. Crouser: Total-energy distribution of field-emitted electrons and single-plane work functions for tungsten. Borcherds: Resistance bias characteristics of the electron microscope gun.













Parts transmission electron microscope